FTIR analysis of thin films. Measurements are done on KBr disks or silicon wafers (or chips). ns3 also has Attenuated Total
Reflection (ATR) capabilities for analyzing thin film coatings on substrates such as polymers and silicon wafers. Please
contact us for a quotation.
ns3 has developed equipment and technology based on their proven technological approach to produce commercial products
based on high rate, low cost plasma coatings on polymeric substrates (including containers), silicon wafers as well as metals,
glass and ceramic surfaces. ns3 works with its corporate partners to develop and commercialize each technology. ns3 is
available for select contract R&D.
We also offer custom coating of your products in our proprietary plasma deposition equipment.
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